IEEE Transactions on Nuclear Science · 1989 · 22 citations · 3 references
EngineeringComputer EngineeringElectrical EngineeringRadiation DosimetryRadiation PhysicsRadiation ProtectionHardware Fault ToleranceLinear Energy TransferRadiation HardeningRadiation SensitivityRadiation-resistant MaterialsCombinational Logic DesignRadiation-hard DevicesRadiation-hard ElectronicsRadiation-hardened Digital Circuit DesignRadiation-hardened Integrated CircuitsRadiation-hardened MicroprocessorsRadiation-hardening TechniquesResistors
A single-chip radiation-hardened 16/32-bit microprocessor (the SA3300) has been designed, fabricated, and tested. The SA3300 is designed to withstand high levels of ionizing radiation and is resistant to single-event upset (SEU) caused by heavy ions. New techniques were used to improve immunity to SEU effects in combinational logic. Testing has demonstrated that the SA3300 is functional after a total gamma dose of 5 Mrad(Si). The device does not suffer latchup from SEU, and parts without SEU resistors have an SEU linear energy transfer (LET) upset threshold greater than 28 MeV/mg/cm/sup 2/.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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