Publication | Closed Access
Etch rates near hot-wall CVD growth temperature for Si-face 4H-SiC using H2 and C3H8
30
Citations
14
References
2008
Year
Materials EngineeringEngineeringApplied PhysicsSemiconductor Device FabricationSilicon On InsulatorPlasma EtchingEtch RatesCarbide
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