Solid-State Electronics · 1983 · 53 citations · 7 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDefect CharacterizationDefect ModelingDefectsDefects In Electronic MaterialsSemiconductor DefectsSemiconductor Device MaterialsDeep-level DefectsDefect PhysicsElectronic Structure Of DefectsGrain Boundary DefectsImpurity DefectsPolysiliconSize-dependent Electronic Properties
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J. Oualid, M. Bonfils, J.P. Crest et al. · Revue de Physique Appliquée · 1982 · 26 citations · Full text
Natural Sciences, Electrical Engineering, Materials Science +13