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Enhanced sensitivity to force gradients by using higher flexural modes of the atomic force microscope cantilever
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1998
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Materials ScienceHigher Flexural ModesEngineeringMicroscopyMicrofabricationMechanicsMechanical EngineeringApplied PhysicsScanning Force MicroscopyScanning Probe MicroscopyNanometrologySoft MatterEnhanced SensitivityNanotribologyNanomechanicsMechanics Of Materials
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