Publication | Closed Access
Diffusion of gold in dislocation-free or highly dislocated silicon measured by the spreading-resistance technique
131
Citations
16
References
1986
Year
Materials ScienceEngineeringDislocation InteractionPhysicsDiffusion ResistanceIntrinsic ImpurityApplied PhysicsDislocated SiliconSolid MechanicsDefect FormationSilicon On InsulatorSpreading-resistance TechniqueMicrostructure
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