Publication | Closed Access
Spectroscopic ellipsometry for in-line monitoring of silicon nitrides
14
Citations
1
References
2004
Year
EngineeringOptical PropertiesSpectroscopyApplied PhysicsSilicon NitridesInstrumentationSilicon On InsulatorSpectroscopic PropertySpectroscopic Method
| Year | Citations | |
|---|---|---|
Page 1
Page 1