Concepedia

Specific contact resistance measurements of the screen-printed Ag thick film contacts in the silicon solar cells by three-point probe methodology and TLM method

Journal of Materials Science Materials in Electronics · 2011 · 61 citations · 25 references

Concepts

Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesThin FilmsMetal-semiconductor ContactsSemiconductor InterfacesSolar Cell MaterialsSolar CellsThin Film Electrical PropertiesContact MetrologyContact ResistanceContact Resistance MeasurementContact Resistance TestingSemiconductor MetrologySilicon Solar CellsSolar Cell CharacterizationThin Film Surface Characterization

References

25

Physics of Semiconductor Devices

Samarth Jain, S. Radhakrishna · 1987 · 4.2K citations

Engineering, Electrical Engineering, Physics +12

Obtaining the specific contact resistance from transmission line model measurements

G.K. Reeves, H.B. Harrison · IEEE Electron Device Letters · 1982 · 1K citations

Engineering, Electrical Engineering, Circuit Theory +16

Densification during Sintering in the Presence of a Liquid Phase. I. Theory

W. D. Kingery · Journal of Applied Physics · 1959 · 1K citations

Engineering, Materials Engineering, Materials Science +17

Models for contacts to planar devices

H.H. Berger · Solid-State Electronics · 1972 · 917 citations

Engineering, Electrical Engineering, Electronic Materials +5

Models for contacts to planar devices

Microelectronics Reliability · 1972 · 818 citations

Engineering, Electrical Engineering, Electronic Materials +5