G.K. Reeves - Concepedia

Author

G.K. Reeves

RMIT University

Also Known As

G K Reeves, G Reeves, G. K. Reeves, G. Reeves, G.K Reeves, G.K. Reeves, Geoff K. Reeves

Publications

1.7K

Citations

H-Index

Concepts

All Affiliations

RMIT University CSIRO Manufacturing Griffith University The Royal Melbourne Hospital Victoria University

About

G.K. Reeves is an author at RMIT University specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	13	1.5K
2	Applied Physics	10	10	206
3	Education	1	1	1K
4	Chemical Engineering	1	1	12
5	Computer Engineering	1	1	18

G.K. Reeves

Publications

1.6K

Citations

H-Index

Page 1

	Year	Citations
Obtaining the specific contact resistance from transmission line model measurements G.K. Reeves, H.B. Harrison IEEE Electron Device Letters Electrical EngineeringEngineeringSpecific ResistanceResistorMeasurement	1982	1K
Specific contact resistance using a circular transmission line model G.K. Reeves Solid-State Electronics Electrical EngineeringEngineeringSpecific Contact ResistanceMechanicsContact Mechanic	1980	265
Reactive ion etching of diamond in CF4, O2, O2 and Ar-based mixtures Patrick W. Leech, G.K. Reeves, Anthony S. Holland Journal of Materials Science	2001	64
Ion beam etching of CVD diamond film in Ar, Ar/O2 and Ar/CF4 gas mixtures Patrick W. Leech, G.K. Reeves, Anthony S. Holland, Diamond and Related Materials Materials ScienceDiamond-like CarbonEngineeringAr/cf4 Gas MixturesIon Beam Etching	2002	29
An analytical model for alloyed ohmic contacts using a trilayer transmission line model G.K. Reeves, B. Harrison IEEE Transactions on Electron Devices Materials EngineeringElectrical EngineeringElectromigration TechniqueEngineeringSpecific Resistance	1995	28
Universal Error Corrections for Finite Semiconductor Resistivity in Cross-Kelvin Resistor Test Structures Anthony S. Holland, G.K. Reeves, Patrick W. Leech IEEE Transactions on Electron Devices EngineeringFinite DepthDefect ToleranceInterconnect (Integrated Circuits)Resistor	2004	25
Characterization of C54 titanium silicide thin films by spectroscopy, microscopy and diffraction Madhu Bhaskaran, Sharath Sriram, K. T. Short, Journal of Physics D Applied Physics	2007	24
Contact resistance of polysilicon silicon interconnections G.K. Reeves, H.B. Harrison Electronics Letters Electrical EngineeringEngineeringPolysilicon Silicon InterconnectionsMicrofabricationPlanar Poly	1982	24
Analytical and Finite-Element Modeling of a Two-Contact Circular Test Structure for Specific Contact Resistivity Y. Pan, G.K. Reeves, Patrick W. Leech, IEEE Transactions on Electron Devices EngineeringMechanical EngineeringInterconnect (Integrated Circuits)Circular ContactsResistor	2013	21
Titanium silicides formed by rapid thermal vacuum processing Cao Dexin, H.B. Harrison, G.K. Reeves Journal of Applied Physics Materials ScienceMaterials EngineeringEngineeringPowder MetallurgyMaterial Processing	1988	18

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