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A rapid reflectance anisotropy spectrometer
34
Citations
17
References
2001
Year
EngineeringChemistrySpectroscopic PropertySpectrochemical AnalysisChemical EngineeringChannel Reflectance AnisotropyOptical PropertiesImaginary Ra SpectraAnalytical ChemistryInstrumentationReflectanceElemental CharacterizationReflectance SpectraReflectance ModelingMaterials ScienceImaging SpectroscopyNatural SciencesSpectroscopyApplied PhysicsSpectroscopic Method
A 16 channel reflectance anisotropy (RA) spectrometer capable of simultaneously acquiring reflectance spectra and real and imaginary RA spectra on the 0.1 s time-scale is reported. Its performance was evaluated by monitoring the electrolytic deposition/growth and removal of copper on a gold(110) surface. The slow deposition enabled very low noise spectra to be obtained, which served as the yardstick with which the spectra obtained during the rapid removal could be compared. The spectra obtained over the 15 s removal mirrored those obtained during the 500 s deposition period. The spectra are discussed in terms of the copper growth being in the form of aligned islands.
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