Reflectance Acquisition

Reflectance Acquisition is a methodological framework within reflectance visualization that systematically captures and quantifies surface reflectance properties through controlled illumination and sensing protocols to enable accurate reconstruction and analysis of material appearance.

78

Publications

4.9K

Citations

295

Authors

126

Institutions

Publications per year

2017–2026

18

Authors

295

  1. HP
    Hendrik P. A. Lensch

    Max Planck Institute for Informatics, Germany

    6 publications · 387 citations

    6

    h-index

  2. PD
    Paul Debevec

    Creative Technologies (United States), United States

    5 publications · 1.2K citations

    5

    h-index

  3. TW
    Tim Weyrich

    University College London, United Kingdom

    5 publications · 479 citations

    5

    h-index

  4. MW
    Michael Weinmann

    University of Bonn, Germany

    4 publications · 140 citations

    4

    h-index

  5. TZ
    Todd Zickler

    Harvard University Press, United States

    4 publications · 287 citations

    4

    h-index

1–5 of 295

Venues

  1. ACM Transactions on Graphics

    TOG · 13 publications · 1.1K citations

    13

    h-index

  2. Sensors

    5 publications · 112 citations

    5

    h-index

  3. Optics Express

    3 publications · 58 citations

    3

    h-index

  4. Remote Sensing

    3 publications · 105 citations

    3

    h-index

  5. Computer Graphics Forum

    3 publications · 298 citations

    3

    h-index

1–5