Secondary electron emission in scanning Ga ion, He ion and electron microscopes

Ion-induced electron emission from clean metals

R. A. Baragiola, E. Vereda Alonso, J. Ferrón et al. · Surface Science · 1979 · 279 citations

Natural Sciences, Materials Engineering, Materials Science +8

A database on electron‐solid interactions

David C. Joy · Scanning · 1995 · 243 citations

Natural Sciences, Materials Science, Physics +12

An Introduction to the Helium Ion Microscope

John Morgan, John Notte, Raymond Hill et al. · Microscopy Today · 2006 · 140 citations · Full text

Natural Sciences, Materials Science, Physics +10

Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction

T. Ishitani · Journal of Electron Microscopy · 2004 · 91 citations

Engineering, Materials Engineering, Materials Science +14

The ALIS He ion source and its application to high resolution microscopy

Raymond Hill, John Notte, Bill Ward · Physics Procedia · 2008 · 55 citations · Full text

Engineering, Aerospace Engineering, Materials Engineering +17