Ferroelectric gate tunnel field-effect transistors with low-power steep turn-on

M. H. Lee, Y.-T. Wei, Jhe-Cyun Lin, C.-W. Chen, Wen‐Hua Tu, Ming Tang

AIP Advances · 2014 · 59 citations · 8 references

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Abstract

Using a ferroelectric PbZrTiO3 gate stack, the range of the steep subthreshold swing in tunnel field-effect transistors was extended by 3.5 orders of magnitude demonstrating an improvement in the swing (by approximately double the slope). The drain conductance (gd) shows only 16% enhancement with large V DS (∼−1.5V) indicates internal voltage amplification with ferroelectric negative capacitance effect beneficial to small lateral drain-source bias voltages (−0.1 V). The concept of coupling the ferroelectric polarization is proposed. The power consumption is also discussed in low-power applications of steep subthreshold slope devices.

References

8