Physical review. B, Condensed matter · 1988 · 114 citations · 15 references
EngineeringMaterials EngineeringMaterials ScienceOptoelectronicsSemiconductor MaterialsSpectroscopyElectronic Band StructureOptical Properties Of SemiconductorsQuantum WellsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsBand AlignmentBand GapDirect Band GapLayer Thickness EffectsPhotoluminescencePhotoluminescence In Quantum WellsPhotoluminescence SpectroscopyQuantum Well Structures
We report the results of a systematic investigation of the effects of decreasing the AlAs layer thickness from 41 to 5 A\r{} on the band alignment of GaAs/AlAs quantum wells in which the GaAs thickness was kept constant at nominally 25 A\r{}. Combining the techniques of photoluminescence and photoluminescence excitation spectroscopy we have mapped out both the direct \ensuremath{\Gamma}-related band gap and the X-\ensuremath{\Gamma} band gap as a function of AlAs thickness. We observe a reversal of the band align- ment from the type-II to the type-I arrangement when the AlAs thickness is reduced below \ensuremath{\sim}13 A\r{}. In addition, we present further evidence which confirms that the type-II emission process is related to the ${X}_{z}$-\ensuremath{\Gamma} pseudodirect band gap. In the structures with very thin (10 A\r{}) AlAs layers we note a significant modification of the type-I excitation spectra where the n=1 exciton peak can be hundreds of times stronger than the apparent absorption in the continuum region.
15
<i>X</i>-point excitons in AlAs/GaAs superlattices
E. Finkman, M. D. Sturge, M. C. Tamargo · Applied Physics Letters · 1986 · 202 citations
D. J. Wolford, T. F. Kuech, J. A. Bradley et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1986 · 193 citations
P. Dawson, K. J. Moore, G. Duggan et al. · Physical review. B, Condensed matter · 1986 · 151 citations