Microstructure and tribological properties of TiN, TiC and Ti(C, N) thin films prepared by closed-field unbalanced magnetron sputtering ion plating

Evaluation of the sp2/sp3 ratio in amorphous carbon structure by XPS and XAES

J. Lascovich, R. Giorgi, S. Scaglione · Applied Surface Science · 1991 · 453 citations

Natural Sciences, Materials Engineering, Materials Science +13

XPS analysis of adsorption of oxygen molecules on the surface of Ti and TiNx films in vacuum

Ju.F. Zhuravlev, V. A. Gubanov · Journal of Electron Spectroscopy and Related Phenomena · 1992 · 200 citations

Natural Sciences, Materials Engineering, Materials Science +16

Characterisation of TiN coatings and of the TiN/Si interface by X-ray photoelectron spectroscopy and Auger electron spectroscopy

Pierre-Yves Jouan, M. C. Peignon, Christophe Cardinaud et al. · Applied Surface Science · 1993 · 196 citations

Natural Sciences, Materials Engineering, Materials Science +11

Low temperature oxidation behavior of reactively sputtered TiN by x‐ray photoelectron spectroscopy and contact resistance measurements

C. Ernsberger, J. T. R. Nickerson, Tony C. Smith et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1986 · 141 citations

Natural Sciences, Materials Engineering, Materials Science +17

The contribution of characteristic energy losses in the core-level X-ray photoelectron spectroscopy peaks of TiN and (Ti, Al)N studied by electron energy loss spectroscopy and X-ray photoelectron spectroscopy

I. leR. Strydom, S. Hofmann · Journal of Electron Spectroscopy and Related Phenomena · 1991 · 140 citations

Natural Sciences, Materials Science, Physics +8