Evaluating the abrasive wear of Zn1−xMnxO heteroepitaxial layers using a nanoscratch technique

Yu-Ming Chang, Hua‐Chiang Wen, Chu-Shou Yang, Derming Lian, Chien‐Huang Tsai, Jyh-Shyang Wang, Wen-Fa Wu, Chang‐Pin Chou

Microelectronics Reliability · 2010 · 17 citations · 28 references

Concepts

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