Publication | Closed Access

Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal

Self-cleaning SurfaceMicroscopyMicroscopy MethodAtomic Force MicroscopeScanning Probe MicroscopyScanning Force MicroscopySubstratum Surface TopographyMicrobial EcologyBacterial RemovalEnvironmental MicrobiologyMicrobiologyMedicineBiophysicsUltrastructure