Atomic Force Microscopy Roughness
Atomic Force Microscopy Roughness is a surface characterization metric that quantifies the nanoscale topographical variations of a material's surface as measured by atomic force microscopy, distinguishing itself from other roughness metrics by its reliance on direct probe-based scanning and sub-nanometer resolution.
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2017–2026
213
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Centre National de la Recherche Scientifique
Paris, France
21 h-index
95 publications
3.7K citations
Universidade de São Paulo
São Paulo, Brazil
15 h-index
53 publications
2.4K citations
Kyung Hee University
Seoul, South Korea
13 h-index
81 publications
2.4K citations
Nanyang Technological University
Singapore, Singapore
11 h-index
30 publications
990 citations
Northwestern University
Evanston, United States
10 h-index
31 publications
2.6K citations
University of Florida
Gainesville, United States
10 h-index
22 publications
907 citations
Kyung Hee University Medical Center
Seoul, South Korea
9 h-index
10 publications
206 citations
Stanford University
Stanford, United States
9 h-index
22 publications
1.7K citations
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33 publications · 2.2K citations
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31 publications · 3.2K citations
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30 publications · 1.1K citations
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JJAP · 31 publications · 1.1K citations
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