Atomic Force Microscopy Roughness

Atomic Force Microscopy Roughness is a surface characterization metric that quantifies the nanoscale topographical variations of a material's surface as measured by atomic force microscopy, distinguishing itself from other roughness metrics by its reliance on direct probe-based scanning and sub-nanometer resolution.

1.1K

Publications

45.1K

Citations

4.7K

Authors

1.3K

Institutions

Publications per year

2017–2026

213

Authors

4.7K

  1. ŞŢ
    Ştefan Ţălu

    Technical University of Cluj-Napoca, Romania

    8 publications · 292 citations

    8

    h-index

  2. SC
    Samjin Choi

    Kyung Hee University, South Korea

    8 publications · 153 citations

    8

    h-index

  3. YC
    Youjin Cheong

    Kyung Hee University, South Korea

    7 publications · 123 citations

    7

    h-index

  4. BB
    Bharat Bhushan

    The Ohio State University, United States

    7 publications · 513 citations

    7

    h-index

  5. HP
    Hun‐Kuk Park

    Kyung Hee University, South Korea

    6 publications · 119 citations

    6

    h-index

1–5 of 4.7K

Venues

  1. Applied Physics Letters

    33 publications · 2.2K citations

    27

    h-index

  2. Langmuir

    31 publications · 3.2K citations

    24

    h-index

  3. Journal of Applied Physics

    30 publications · 1.1K citations

    20

    h-index

  4. 19

    h-index

  5. Japanese Journal of Applied Physics

    JJAP · 31 publications · 1.1K citations

    19

    h-index

1–5