Publication | Closed Access

An introduction to fast wafer level reliability monitoring for integrated circuit mass production

ReliabilityElectrical EngineeringReliability EngineeringEngineeringHardware ReliabilityMeasurementIndustrial EngineeringComputer EngineeringEducationCircuit ReliabilityIntegrated CircuitsReliability PredictionInstrumentationElectronic PackagingMicroelectronicsPhysic Of FailureDevice Reliability