Ion-beam-induced reactions in metal-semiconductor and metal-metal thin film structures

Thin Films—Interdiffusion and Reactions

J. M. Poate, K. N. Tu, Jean-Claude Mayor et al. · Journal of The Electrochemical Society · 1979 · 1.7K citations

Natural Sciences, Materials Engineering, Materials Science +12

Continuous Series of Metastable Solid Solutions in Silver-Copper Alloys

Pol Duwez, R. H. Willens, William Klement · Journal of Applied Physics · 1960 · 711 citations

Natural Sciences, Materials Engineering, Metallurgy +5

The depth resolution of sputter profiling

H. H. Andersen · Applied Physics A · 1979 · 596 citations

Computing, Computer Science, Metrology +5

Recoil mixing in solids by energetic ion beams

U. Littmark, Wolfgang Höfer · Nuclear Instruments and Methods · 1980 · 315 citations

Natural Sciences, Nuclear Engineering, Physics +9

Distortion of depth profiles during sputtering

Peter Sigmund, A. Gras-Martí · Nuclear Instruments and Methods · 1980 · 200 citations

Natural Sciences, Materials Engineering, Materials Science +7