Electrical characterization and modeling of MOS structures with an ultra-thin oxide - Concepedia

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Electrical characterization and modeling of MOS structures with an ultra-thin oxide

25

Citations

25

References

2002

Year

R. Clerc, B. De Salvo, G. Ghibaudo, G. Reimbold, G. Pananakakis

Solid-State Electronics

Materials ScienceElectrical EngineeringEngineeringOxide ElectronicsApplied PhysicsElectrical CharacterizationMos StructuresGallium OxideSemiconductor MaterialMicroelectronicsUltra-thin OxideSemiconductor Device

References

	Year	Citations

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