On the use of atomic force microscopy for structural mapping of metallic-glass thin films - Concepedia

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On the use of atomic force microscopy for structural mapping of metallic-glass thin films

25

Citations

19

References

2013

Year

Jianrong Zeng, Jinn P. Chu, Y.C. Chen, Antoine Volland, J.J. Blandin, S. Gravier, Yong Yang

Materials ScienceAtomic Force MicroscopyStructural MappingEngineeringMicrofabricationMicroscopyMetallic-glass Thin FilmsSurface ScienceApplied PhysicsScanning Force MicroscopyScanning Probe MicroscopyNanometrologyAmorphous MetalThin FilmsMicrostructureMetallography

References

	Year	Citations

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