Physical Review Letters · 2006 · 104 citations · 16 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSemiconductor MaterialsSurface SciencePhotoelectron SpectroscopyQuantum WellsSemiconductor PhysicsSemiconductor SurfacesSurface PhysicsSurface SpectroscopyAngle-resolved Photoelectron SpectroscopyAngle-resolved Photoemission SpectroscopyFermi LevelFermi SurfaceQuantum Well Band StructureSemiconductor Surface Preparation
Electron accumulation states in InN have been measured using high resolution angle-resolved photoemission spectroscopy (ARPES). The electrons in the accumulation layer have been discovered to reside in quantum well states. ARPES was also used to measure the Fermi surface of these quantum well states, as well as their constant binding energy contours below the Fermi level E(F). The energy of the Fermi level and the size of the Fermi surface for these quantum well states could be controlled by varying the method of surface preparation. This is the first unambiguous observation that electrons in the InN accumulation layer are quantized and the first time the Fermi surface associated with such states has been measured.
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Nitride-based semiconductors for blue and green light-emitting devices
F. A. Ponce, D. P. Bour · Nature · 1997 · 1.7K citations
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Natural Sciences, Materials Engineering, Materials Science +17
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