The Medical Journal of Australia · 1984 · 38 citations · 4 references
EngineeringComputer EngineeringSystems EngineeringBenefit-cost AnalysisCost-benefit AnalysisCost-utility AnalysisComputer-based TestingCost MeasurementCost Performance AnalysisDesign For TestabilitySoftware TestingTest TheoryDigital Circuit Self-testingMicroprocessor Built-in Self-testSelf-testTesting Cost
This paper presents an economic model of the testing process. This model is used to analyse the costs associated with producing and testing systems designed using self-testing ICs. A comparison is made between the costs arising from the use of self-testing ICs and those associated with the use of both LSSD and traditional test methods.
4
Integrated circuit yield statistics
C.H. Stapper, F.M. Armstrong, K. Saji · Proceedings of the IEEE · 1983 · 405 citations
Engineering, Electrical Engineering, Manufacturing Engineering +15
Test generation costs analysis and projections
Prabhakar Goel · 1980 · 169 citations · Full text
The MC6804P2 Built-In Self-Test.
John R. Kuban, Bill Bruce · International Test Conference · 1983 · 13 citations