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Green light emission from InGaN multiple quantum wells grown on GaN pyramidal stripes using selective area epitaxy
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Citations
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References
2008
Year
Optical MaterialsEngineeringOptoelectronic DevicesSemiconductorsOptical PropertiesCompound SemiconductorPyramidal Gan StripesNanophotonicsPhotonicsElectrical EngineeringPhotoluminescencePhysicsSidewall FacetsSelective Area EpitaxyOptoelectronic MaterialsAluminum Gallium NitrideCategoryiii-v SemiconductorGreen Light EmissionSolid-state LightingApplied PhysicsGan Pyramidal StripesGan Power DeviceOptoelectronics
Selective area epitaxy has been used to grow pyramidal GaN stripes, followed by InGaN multiple quantum well (MQW) structures, in order to produce long-wavelength green light emission. Stripes oriented along ⟨112¯0⟩ produce smooth {11¯01} sidewall facets. The room-temperature optical properties are investigated by cathodoluminescence spectroscopy using a scanning electron microscope. MQWs grown in unmasked reference regions exhibit emission at 450 nm. The stripe sidewalls emit light with peak wavelength of 500 nm with consistent linewidth and intensity. The stripe ridge emits light with peak intensity at wavelength of ∼550 nm. Based on the spatial extent of the 550 nm emission, the ridge is estimated to be ∼250 nm wide. The large redshift is produced by the enhanced presence of indium species due to lateral vapor diffusion and surface migration in selective area epitaxy.
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