Zone-melting recrystallization of 3-in.-diam Si films on SiO2-coated Si substrates

John C. C. Fan, B-Y. Tsaur, R. L. Chapman, M. W. Geis

Applied Physics Letters · 1982 · 33 citations · 6 references

Concepts

Abstract

We have constructed a scaled-up graphite strip-heater system that permits routine zone-melting recrystallization of 3-in.-diam Si films on SiO2-coated Si wafers. The recrystallized films are similar in crystal quality to those obtained previously in a smaller system, except that they contain higher densities of small protrusions along the subgrain boundaries. Seeded recrystallization has been accomplished by scribing a stripe opening, that extends through the Si and SiO2 films to the Si wafer.

References

6