Thickness Dependence of Material Properties of Epitaxial Pb(Zr<sub>x</sub>Ti<sub>1-x</sub>)O<sub>3</sub> Films on Ir/(100) (ZrO<sub>2</sub>)<sub>1-x</sub>(Y<sub>2</sub>O<sub>3</sub>)<sub>x</sub>/(100)Si Structures - Concepedia

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Thickness Dependence of Material Properties of Epitaxial Pb(Zr<sub>x</sub>Ti<sub>1-x</sub>)O<sub>3</sub> Films on Ir/(100) (ZrO<sub>2</sub>)<sub>1-x</sub>(Y<sub>2</sub>O<sub>3</sub>)<sub>x</sub>/(100)Si Structures

26

Citations

18

References

1999

Year

Sadayoshi Horii, Seiji Yokoyama, Hideki Nakajima, Susumu Horita

Japanese Journal of Applied Physics

Materials ScienceEpitaxial PbThickness DependenceMaterial PropertiesEngineeringApplied PhysicsCondensed Matter PhysicsSemiconductor MaterialThin Film Process TechnologyThin FilmsEpitaxial Growth

References

	Year	Citations

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