Charging-Effects in RF capacitive switches influence of insulating layers composition

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Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches Xiaobin Yuan, James C. M. Hwang, David Forehand, IEEE MTT-S International Microwave Symposium Digest, 2005. Electrical EngineeringDielectricsEngineeringSteady-state Charge DensitiesActuation Voltage	2005	113
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Distributed dielectric charging and its impact on RF MEMS devices Xavier Rottenberg, Bart Nauwelaers, W. De Raedt, AMS Acta (University of Bologna) DielectricsEngineeringRadio FrequencyCharge TransportMicro-electromechanical System	2004	84
Charging of radiation induced defects in RF MEMS dielectric films M. Exarchos, E. Papandreou, P. Pons, Microelectronics Reliability Electrical EngineeringDielectricsEngineeringApplied PhysicsTime-dependent Dielectric Breakdown	2006	27

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