Japanese Journal of Applied Physics · 1993 · 35 citations · 7 references
Natural SciencesMaterials SciencePhysicsSemiconductor MaterialsSurface ScienceThin FilmsChemical Vapor DepositionDefect CharacterizationElectronic Material CharacterizationElectronic Structure Of SolidsSemiconductor SurfacesSurface PhysicsAmorphous CarbonDefect DensityDefect FormationDefect StatesElectron Energy LossElectron Energy-loss SpectroscopyElectronic Structure AnalysisSurface Defects Characterization
The electronic structure of the surface and defect density in diamond films as-grown and cooled in an oxygen ambient after deposition have been investigated by means of electron energy loss and electron spin resonance spectroscopies. As-grown diamond films contain an amorphous carbon phase and a larger amount of defects in the surface region compared with the bulk region.
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