Japanese Journal of Applied Physics · 2007 · 10 citations · 10 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsQuantum Well DevicesQuantum WellsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor LasersSemiconductor PhysicsAging TestsIntegrated Semiconductor LasersQuantum Well LasersThermal Management In Semiconductor LasersTunnel Junction LasersType-ii Quantum WellsVertical-cavity Surface-emitting Lasers
We propose 1.1-µm-range InGaAs quantum-well (QW) vertical-cavity surface-emitting lasers (VCSELs) with a buried type-II tunnel junction (BTJ). Because of the low electrical resistance of the type-II tunnel junction, the chip resistance was reduced by over 40% compared with conventional oxide-confined VCSELs with the same-size aperture. In an aging test, stable operation at 85 °C was maintained in terms of optical and electrical characteristics for over 1000 h without early failure. The introduction of the type-II TJ structure can suppress self-heating caused by the chip resistance and may be a practical approach to achieving high-speed VCSELs for advanced optical interconnection.
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S. Weisser, E.C. Larkins, K. Czotscher et al. · IEEE Photonics Technology Letters · 1996 · 84 citations · Full text