Characterization of proton damage in light-emitting diodes

Abstract

Proton damage is investigated for several types of modern light-emitting diodes (LEDs), examining the damage from the standpoint of older models based on lifetime degradation as well as the simpler method of normalized degradation. An empirical model is developed to describe injection-enhanced annealing in amphoterically doped LEDs. Experimental results on "aged" devices show that wearout degradation does not decrease the sensitivity of devices to radiation damage.