Publication | Closed Access
Measurement of the transient junction temperature in MOSFET devices under operating conditions
62
Citations
5
References
2007
Year
Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringBias Temperature InstabilityTransient Junction TemperatureMosfet DevicesCircuit ReliabilityThermodynamicsHeat TransferOperating ConditionsThermal EngineeringDevice Reliability
| Year | Citations | |
|---|---|---|
Page 1
Page 1