Direct Observation at Nanoscale of Resistance Switching in NiO Layers by Conductive-Atomic Force Microscopy

Damien Deleruyelle, C. Dumas, M. Carmona, Christophe Müller, Sabina Spiga, M. Fanciulli

Applied Physics Express · 2011 · 20 citations · 20 references

Concepts

Abstract

International audience

References

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