Test strategy planning using economic analysis

Design for testability—A survey

T.W. Williams, Kenneth P. Parker · Proceedings of the IEEE · 1983 · 393 citations

Engineering, Systems Engineering, Fault Tolerance +8

Implementing a Built-In Self-Test PLA Design

Robert Treuer, Hideo Fujiwara, V.K. Agarwal · IEEE Design & Test of Computers · 1985 · 87 citations

Engineering, Computer Engineering, Computer Science +15

Economic effects in design and test

Ian Dear, C. Dislis, A.P. Ambler et al. · IEEE Design & Test of Computers · 1991 · 39 citations

Engineering, Economics, Electrical Engineering +13

Analysis of testable PLA designs

Xi-an Zhu, M.A. Breuer · IEEE Design & Test of Computers · 1988 · 26 citations

Engineering, Computer Engineering, Computer Science +15

Cost analysis of test method environments

C. Dislis, Ian Dear, J.R. Miles et al. · 2003 · 26 citations

Management, Systems Engineering, Cost Management +16