Concepedia

Ian Dear

ID

Statistics

Publications

6

Citations

176

H-Index

6

Active since

1986

Affiliations

Brunel University of London(Current)

Siemens (Germany)

Ian Dear is an author at Brunel University of London specializing in design for testability, engineering, and cost analysis.

Publications per year

1986–2021

6

Publications

6

no Routing Needed Between Capsules

Ian Dear · Brunel University Research Archive (BURA) (Brunel University London) · 2021 · 73 citations · Full text

Computing, Computer Science, Capsule Technology +7

Economic effects in design and test

Ian Dear, C. Dislis, A.P. Ambler et al. · IEEE Design & Test of Computers · 1991 · 39 citations

Engineering, Economics, Electrical Engineering +13

Cost analysis of test method environments

C. Dislis, Ian Dear, J.R. Miles et al. · 2003 · 26 citations

Management, Systems Engineering, Cost Management +16

Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI.

Mark Paraskeva, A.P. Ambler, D. F. Burrows et al. · International Test Conference · 1986 · 14 citations

Engineering, Computer Engineering, Computer Science +15

Economics modelling for the determination of test strategies for complex VLSI boards

C. Dislis, Jochen Dick, Ian Dear et al. · 2002 · 14 citations

Engineering, Computer Engineering, Economics +6

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