Imaging the surface of silica microparticles with the atomic force microscope: a novel sample preparation method

Kevin M. Shakesheff, Martyn C. Davies, David E. Jackson, Clive J. Roberts, Saul J. B. Tendler, V. A. Brown, R.C Watson, David A. Barrett, P. Nicholas Shaw

Surface Science · 1994 · 20 citations · 15 references

Concepts

References

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