Ellipsometric and XPS characterization of transparent nickel oxide thin films deposited by reactive HiPIMS

Duc Tuong Nguyen, A. Ferrec, Julien Kéraudy, Mireille Richard‐Plouet, A. Goullet, L. Cattin, Luc Brohan, Pierre-Yves Jouan

Surface and Coatings Technology · 2014 · 23 citations · 13 references

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