Thin Solid Films · 1995 · 21 citations · 15 references
EngineeringMaterials EngineeringMaterials ScienceMaterials ChemistryOptical MaterialsPhotonicsChemical BondingPorous MaterialsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor SurfacesSilicon MaterialsBondingPorous SiliconSiliconSilicon ChemistrySilicon Optical Properties
15
Siloxene: Chemical quantum confinement due to oxygen in a silicon matrix
Péter Deák, M. Rosenbauer, M. Stutzmann et al. · Physical Review Letters · 1992 · 189 citations
Natural Sciences, Chemistry, Physics +17