High strain rate compression behavior for Sn–37Pb eutectic alloy, lead-free Sn–1Ag–0.5Cu and Sn–3Ag–0.5Cu alloys

S.T. Jenq, Hsuan-Hu Chang, Yi‐Shao Lai, Tsung-Yueh Tsai

Microelectronics Reliability · 2009 · 30 citations · 13 references

Concepts

References

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