Development of a standard for transient measurement of junction-to-case thermal resistance - Concepedia

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Development of a standard for transient measurement of junction-to-case thermal resistance

32

Citations

9

References

2012

Year

H. Pape, Dirk Schweitzer, Liu Chen, Rudolf Kutscherauer, Martin Walder

Microelectronics Reliability

Electrical EngineeringEngineeringMeasurementEducationThermal AnalysisTransient MeasurementJunction-to-case Thermal ResistanceThermal ModelingThermodynamicsInstrumentationHeat TransferElectronic PackagingThermal EngineeringThermal SensorThermal ConductionThermal ConductivityElectrical Insulation

References

	Year	Citations

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