Concepedia

Spectroscopic ellipsometric modeling of a Bi–Te–Se write layer of an optical data storage device as guided by atomic force microscopy, scanning electron microscopy, and X-ray diffraction

Hao Wang, Nitesh Madaan, Jacob D. Bagley, Anubhav Diwan, Yiqun Liu, Robert C. Davis, Barry M. Lunt, Stacey J. Smith, Matthew R. Linford

Thin Solid Films · 2014 · 15 citations · 15 references

DOI

Concepts

References

15

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

Craig M. Herzinger, Blaine Johs, William A. McGahan et al. · Journal of Applied Physics · 1998 · 1.1K citations

, , +17

Spectroscopic ellipsometry data analysis: measured versus calculated quantities

G. E. Jellison · Thin Solid Films · 1998 · 370 citations

, , +8

Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

John A. Woollam, Blaine Johs, Craig M. Herzinger et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 218 citations

, , +8

Spectroscopic ellipsometry characterization of electrochromic tungsten oxide and nickel oxide thin films made by sputter deposition

Iryna Valyukh, S.V. Green, Hans Arwin et al. · Solar Energy Materials and Solar Cells · 2010 · 104 citations · Full text

, , +17

Chalcogenide thin films for laser-beam recordings by thermal creation of holes

Motoyasu Terao, Kazuo Shigematsu, Masahiro Ojima et al. · Journal of Applied Physics · 1979 · 70 citations

, , +16