Hans Arwin

Infrared dielectric functions and phonon modes of high-quality ZnO films

N. Ashkenov, Beri N. Mbenkum, Carsten Bundesmann et al. · Journal of Applied Physics · 2002 · 621 citations

Semiconductors, Materials Science, Phonon Modes +15

Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry

T. W. H. Oates, Herbert Wormeester, Hans Arwin · Progress in Surface Science · 2011 · 215 citations

Materials Science, Plasmonics, Engineering +11

Total internal reflection ellipsometry: principles and applications

Hans Arwin, Michal Poksinski, Knut Johansen · Applied Optics · 2004 · 207 citations

Engineering, Optic Design, Optical Testing +18

A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering

Shaobin Guo, Hans Arwin, Sissel N. Jacobsen et al. · Journal of Applied Physics · 1995 · 203 citations

Thin Film Physics, Optical Materials, Engineering +22

Increased electromechanical coupling in w−ScxAl1−xN

Gunilla Wingqvist, Ferenc Tasnádi, Agnė Žukauskaitė et al. · Applied Physics Letters · 2010 · 199 citations · Full text

Materials Engineering, Materials Science, Electrical Engineering +12