Hans Arwin

Infrared dielectric functions and phonon modes of high-quality ZnO films

N. Ashkenov, Beri N. Mbenkum, Carsten Bundesmann et al. · Journal of Applied Physics · 2002 · 627 citations

Natural Sciences, Materials Science, Physics +17

Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry

T. W. H. Oates, Herbert Wormeester, Hans Arwin · Progress in Surface Science · 2011 · 216 citations

Natural Sciences, Materials Engineering, Materials Science +16

Total internal reflection ellipsometry: principles and applications

Hans Arwin, Michal Poksinski, Knut Johansen · Applied Optics · 2004 · 208 citations

Natural Sciences, Materials Engineering, Materials Science +17

A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering

Shaobin Guo, Hans Arwin, Sissel N. Jacobsen et al. · Journal of Applied Physics · 1995 · 205 citations

Natural Sciences, Materials Science, Physics +17

Increased electromechanical coupling in w−ScxAl1−xN

Gunilla Wingqvist, Ferenc Tasnádi, Agnė Žukauskaitė et al. · Applied Physics Letters · 2010 · 204 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16