Michal Poksinski

Total internal reflection ellipsometry: principles and applications

Hans Arwin, Michal Poksinski, Knut Johansen · Applied Optics · 2004 · 208 citations

Natural Sciences, Materials Engineering, Materials Science +17

Protein monolayers monitored by internal reflection ellipsometry

Michal Poksinski, Hans Arwin · Thin Solid Films · 2004 · 105 citations

Life Sciences, Biochemistry, Biophysics +11

In situ monitoring of metal surfaces exposed to milk using total internal reflection ellipsometry

Michal Poksinski, Hans Arwin · Sensors and Actuators B Chemical · 2003 · 47 citations

Natural Sciences, Food Science, Materials Science +11

Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions

Hans Arwin, Michal Poksinski, K. M. Johansen · physica status solidi (a) · 2008 · 33 citations

Natural Sciences, Materials Engineering, Materials Science +17

Formation and cross-linking of fibrinogen layers monitored with in situ spectroscopic ellipsometry

Torun Berlind, Michal Poksinski, Pentti Tengvall et al. · Colloids and Surfaces B Biointerfaces · 2009 · 28 citations · Full text

Natural Sciences, Chemistry, Materials Science +14