Applied Physics Letters · 1983 · 99 citations · 5 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials ChemistrySemiconductor MaterialsAlloysAmorphous MaterialsSemiconducting MaterialsSemiconductor Crystal GrowthSemiconductor Thin FilmsThin-film MaterialsAlloy SemiconductorsAmorphous AlloysCrystalline StructureCrystallizationDirect Band GapExcimer LasersMetastable Alloy PhasesX-ray Diffraction Analysis
Thin microcrystalline films of the metastable semiconducting alloy Ge1−xSnx (x≊0.22) have been formed using excimer laser radiation to crystallize amorphous sputtered films on glass and semiconducting crystalline substrates. X-ray diffraction, electroreflectance, and Raman spectroscopy have been used to characterize the semiconducting material which is stable to at least 200 °C. The study demonstrates the possibility of extending earlier studies of amorphous Ge1−xSnx alloys into a crystalline regime with a direct band-gap variable with x from 0 up to about 0.5 eV. The crystallization technique is potentially applicable to the formation of other metastable semiconducting compounds of device potential.
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Steven Groves, William Paul · Physical Review Letters · 1963 · 330 citations
C.J. Buchenauer, M. Cardona, Fred H. Pollak · Physical review. B, Solid state · 1971 · 68 citations
Electroreflectance and band structure of gray tin
M. Cardona, Paul T. McElroy, Fred H. Pollak et al. · Solid State Communications · 1966 · 40 citations
Natural Sciences, Materials Engineering, Materials Science +14