Japanese Journal of Applied Physics · 2002 · 36 citations · 5 references
Natural SciencesMaterials EngineeringMaterials ScienceInstrumentationMaterials CharacterizationMaterials PhysicsAtomic Force MicroscopyElectrode MaterialsFerroelectric MaterialsPiezoelectric MaterialsScanning Probe MicroscopyDisplacementFerroelectric PropertiesHysteresisLead Zirconate TitanatePiezoelectric CharacterizationPiezoelectric EffectPiezoelectric PropertiesPolarization Hysteresis
An atomic force microscope (AFM) probing system was connected with a ferroelectric test system to measure the polarization hysteresis (P–E) curve and longitudinal displacement properties simultaneously with a large AC drive signal at 5 Hz, since this measurement system has the advantages of enabling dynamic evaluation of longitudinal displacement and direct comparison of the ferroelectric and piezoelectric properties. With decreasing the top electrode diameter from 500 to 30 µm, the longitudinal displacement direction changes from negative to positive since the longitudinal piezoelectric effect becomes dominant. The longitudinal piezoelectric constant calculated with a unipolar signal (+5 V, 5 Hz) was d33 =108 pm/V for a 30-µm-dia top electrode. This value is lower than that of bulk PZT but higher than that of reported data measured using the double-beam laser interferometer or the AFM with a small AC signal of about 1 kHz.
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Takaaki Tsurumi, Shuichi Ozawa, Goro ABE et al. · Japanese Journal of Applied Physics · 2000 · 49 citations
Natural Sciences, Materials Engineering, Materials Science +17
Preparation of Al Doped PZT Thin Films Using a Sol-Gel Method
Takashi Iijima, N. Sanada, K. Hiyama et al. · MRS Proceedings · 1999 · 10 citations
Natural Sciences, Materials Engineering, Materials Science +12