Applied Physics Express · 2012 · 63 citations · 21 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor MaterialsDopingIii-v SemiconductorsLight-emitting DiodesOptical Properties Of SemiconductorsSemiconductor Device MaterialsSemiconductor PhysicsCrystalline StructureDiffraction AnalysisGallium NitrideGallium Nitride (Gan) MaterialsGallium Nitride Light-emitting DiodesHeterojunction DevicesLight-emitting DevicesSemiconductor Light-emitting Materials
We grew a heterojunction combination of Mg-doped Ga-rich InGaN cladding and In-rich InGaN active layers on top of Si-doped GaN nanocolumns with a diameter of ∼300 nm; the uniformly arranged and dislocation-free GaN nanocolumns contributed to the high crystalline quality of In-rich InGaN, which led to the longest-wavelength (1.46 µm) operation of InGaN light emitting diodes. The In content of the active layer estimated from the emission peak wavelength was 0.86. The selected-area diffraction analysis in the transmission electron microscope for the InGaN layers evinced that the In contents of the Ga-rich and In-rich InGaN layers were approximately 0.3 and 0.85, respectively.
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Band parameters for nitrogen-containing semiconductors
I. Vurgaftman, J. R. Meyer · Journal of Applied Physics · 2003 · 2.7K citations
Unusual properties of the fundamental band gap of InN
Junqiao Wu, W. Walukiewicz, K. M. Yu et al. · Applied Physics Letters · 2002 · 1.5K citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17
Small band gap bowing in In1−xGaxN alloys
Junqiao Wu, W. Walukiewicz, K. M. Yu et al. · Applied Physics Letters · 2002 · 611 citations · Full text