Physical review. B, Condensed matter · 1996 · 46 citations · 20 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsOptical MaterialsSemiconductor MaterialsDislocation MechanicsDislocations In SemiconductorsOptical Properties Of SemiconductorsOptical Properties Of SolidsSemiconductor PhysicsSemiconductor SurfacesAnisotropic StrainAnisotropyCritical PointsDislocationsLattice PeriodicityReflectanceStrain EffectsStrain Effects On Optical Properties
We develop a model to describe reflectance-difference (RD) spectra of zinc-blende semiconductors due to strains induced by \ensuremath{\alpha} and \ensuremath{\beta} 60\ifmmode^\circ\else\textdegree\fi{} dislocations. It is shown that near the semiconductor surface, as a result of the lost of lattice periodicity, dislocations result in an anisotropic average strain that changes the symmetry from cubic to orthorhombic, thus leading to a reflectance anisotropy. We obtain expressions for RD spectra at critical points of both \ensuremath{\Gamma} and \ensuremath{\Lambda} symmetry that predict first-derivative RD line shapes as long as the strain-induced energy shifts are small compared to spectra broadening energies. Furthermore, we report on RD spectra of semi-insulating GaAs (100) in the 1.2--5.5-eV energy range and show that such spectra comprise a component that is well described by our model. \textcopyright{} 1996 The American Physical Society.
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Piezo-Electroreflectance in Ge, GaAs, and Si
Fred H. Pollak, M. Cardona · Physical Review · 1968 · 852 citations
Natural Sciences, Materials Engineering, Materials Science +16