Intrinsic optical and structural properties of SrS thin films

Elements of X-ray Diffraction

E. D. T. Atkins · Physics Bulletin · 1978 · 7.1K citations

Natural Sciences, Materials Science, Physics +9

Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · Journal of Physics E Scientific Instruments · 1983 · 3.9K citations

Natural Sciences, Materials Engineering, Materials Science +17

New developments in IIa–VIb (alkaline-earth chalcogenide) binary semiconductors

Y. Kaneko, Takao Kōda · Journal of Crystal Growth · 1988 · 200 citations

Engineering, Chemistry, Materials Science +14

An XPS study of the dopants' valence states and the composition of CaS1 − xSex:Eu and SrS1 − xSex:Ce thin film electroluminescent devices

R. Vercaemst, Dirk Poelman, R.L. Van Meirhaeghe et al. · Journal of Luminescence · 1995 · 76 citations

Natural Sciences, Materials Engineering, Materials Science +17

Influence of the growth conditions on the properties of CaS:Eu electroluminescent thin films

Dirk Poelman, R. Vercaemst, R.L. Van Meirhaeghe et al. · Journal of Luminescence · 1997 · 27 citations

Natural Sciences, Materials Engineering, Materials Science +12