Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing

Test metrics for analog parametric faults

Stephen Sunter, N. Nagi · 2003 · 97 citations

Engineering, Electrical Engineering, Analog Electronics +16

Analog circuit testing based on sensitivity computation and new circuit modeling

N.B. Hamida, Bożena Kamińska · 2002 · 80 citations

Engineering, Electrical Engineering, Analog Electronics +14

Parametric fault simulation and test vector generation

Khaled Saab, Naim Ben‐Hamida, Bożena Kamińska · 2000 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +17

Defect level evaluation in an IC design environment

José T. de Sousa, F.M. Gonçalves, J.P. Teixeira et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1996 · 45 citations

Engineering, Computer Engineering, Electrical Engineering +17

CAT platform for analogue and mixed-signal test evaluation and optimization

Ahcène Bounceur, Salvador Mir, L. Rolindez et al. · 2006 · 29 citations

Engineering, Electrical Engineering, Analog Electronics +13