Solid-State Electronics · 1982 · 59 citations · 26 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsMetal-semiconductor ContactsMetalsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor PhysicsSemiconductor ReliabilityAnnealing EffectsAnnealing Temperature EffectsContact ResistanceThermal AnnealingVolatile Loss
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Surface stoichiometry and structure of GaAs
John R. Arthur · Surface Science · 1974 · 330 citations
Natural Sciences, Materials Engineering, Materials Science +12
(Institute of Physics Conference Series No. 142)
K. Nassau · Materials Research Bulletin · 1997 · 201 citations
Alloying behavior of Ni/Au-Ge films on GaAs
Masaki Ogawa · Journal of Applied Physics · 1980 · 136 citations