Development of a rapid profilometer with an application to roundness gauging

The Topografiner: An Instrument for Measuring Surface Microtopography

Russell D. Young, John F. Ward, Fredric Scire · Review of Scientific Instruments · 1972 · 328 citations

Natural Sciences, Materials Engineering, Materials Science +16

Optical techniques for on-line measurement of surface topography

Theodore V. Vorburger, E. Clayton Teague · Precision Engineering · 1981 · 179 citations

Engineering, Geoinformatics, Optics +14

A new multiprobe method of roundness measurements

Wei Gao, Satoshi KIYONO, Tadatoshi Nomura · Precision Engineering · 1996 · 95 citations

Engineering, Mechanical Engineering, Instrumentation +7

Scanning capacitance microscopy

C. D. Bugg, P. J. King · Journal of Physics E Scientific Instruments · 1988 · 86 citations

Natural Sciences, Electrical Engineering, Materials Science +17

High-accuracy roundness measurement by a new error separation method

Wei Gao, Satoshi KIYONO, Takamitu Sugawara · Precision Engineering · 1997 · 67 citations

Engineering, Educational Measurement, Instrumentation +11